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In-situ measurement of radiation-induced conductivity of thin film ceramics

✍ Scribed by J.D. Hunn; R.E. Stoller; S.J. Zinkle


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
582 KB
Volume
219
Category
Article
ISSN
0022-3115

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## Abstract Metallic thin‐film plasticity has been widely studied by using the difference between the coefficients of thermal expansion of the film and the underlying substrate to induce stress. This approach is commonly known as the wafer curvature technique, based on the Stoney equation, which ha