In-situ infrared study of the silicon surface in HF electrolyte
โ Scribed by A.Venkateswara Rao; F. Ozanam; J.-N. Chazalviel
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 275 KB
- Volume
- 54-55
- Category
- Article
- ISSN
- 0368-2048
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Porous silicon has been studied using in situ infrared spectroscopy combined with photoluminescence, electroluminescence, photomodulated and electromodulated infrared absorption, when the porous layer is either chemically etched in HF or anodically oxidized. Infrared vibrational spectra indicate tha
The potential distribution at the silicon/electrolyte interface was studied in HF solutions using capacitance measurements in conjunction with impedance measurements over a wide frequency range. The electrode impedance was sensitive to the reactions occurring during anodic polarization. The n silico