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In situ infrared ellipsometry study of the vibrational properties, and the growth of amorphous semiconductor ultrathin films

✍ Scribed by N Blayo; B Drévillon; J Huc

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 281 KB
Volume: 41
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(90)93952-f

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