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In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction

✍ Scribed by C. Zhao; G. Roebben; H. Bender; E. Young; S. Haukka; M. Houssa; M. Naili; S. De Gendt; M. Heyns; O. Van Der Biest

No coin nor oath required. For personal study only.

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