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In Situ Atomic Force Microscopy Studies of the Deposition of Cerium Oxide Films on Regularly Corrugated Surfaces

✍ Scribed by Li, Feng-Bin

Book ID
121717100
Publisher
The Electrochemical Society
Year
1999
Tongue
English
Weight
676 KB
Volume
146
Category
Article
ISSN
0013-4651

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In situ atomic force microscopy studies
In situ atomic force microscopy studies of electrodeposition mechanism of cerium oxide films: nucleation and growth out of a gel mass precursor
✍ Feng-Bin Li; R.C. Newman; G.E. Thompson πŸ“‚ Article πŸ“… 1997 πŸ› Elsevier Science 🌐 English βš– 992 KB

situ atomic force microscopy (AFM) of the electrochemical deposition of cerium oxide coatings is presented for the first time. The AFM images and the tip-deposit interaction, observed during early stages of deposition, demonstrate clearly the presence of a transitional gel state of the depositing ma