In situ analysis of thin film deposition process using time of flight (TOF) ion beam analysis methods

Time-of-flight elastic recoil analysis o

Time-of-flight elastic recoil analysis of ion beam modified nitrocellulose thin films

✍ James H. Arps; Robert A. Weller 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 443 KB

3108. Thin-film deposition using low-ene

3108. Thin-film deposition using low-energy ion beams (2) Pb+ ion-beam deposition and analysis of deposits

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 133 KB

of Ti to a few percent. Pre-evaporation of a 300 ,~ thick CaF.~ parting layer allowed membrane removal by water-assisted peeling. Pressure testing showed membranes to have bulk tensile strength of 4.6-6.2,'< l09 dyn/cm 2 (68-92 kpsi) and to behave elastically. They could be mounted under high tensio

3109. Thin-film deposition using low-ene

3109. Thin-film deposition using low-energy ion beams (3) Mg+ ion-beam deposition and analysis of deposits

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 133 KB

of Ti to a few percent. Pre-evaporation of a 300 ,~ thick CaF.~ parting layer allowed membrane removal by water-assisted peeling. Pressure testing showed membranes to have bulk tensile strength of 4.6-6.2,'< l09 dyn/cm 2 (68-92 kpsi) and to behave elastically. They could be mounted under high tensio

3123. Thin-film deposition using low-ene

3123. Thin-film deposition using low-energy ion beams (2) Pb+ ion-beam deposition and analysis of deposits

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 139 KB

3124. Thin-film deposition using low-ene

3124. Thin-film deposition using low-energy ion beams (3) Mg+ ion-beam deposition and analysis of deposits

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 139 KB

Atmosphere influence on in-situ ion beam

Atmosphere influence on in-situ ion beam analysis of thin film growth

✍ Yuping Lin; Alan R. Krauss; Robert P.H. Chang; Orlando H. Auciello; Dieter M. Gr 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 581 KB