𝔖 Bobbio Scriptorium
✦   LIBER   ✦

In-flight and ground testing of single event upset sensitivity in static RAMs

✍ Scribed by Johansson, K.; Dyreklev, P.; Granbom, O.; Calver, M.C.; Fourtine, S.; Feuillatre, O.


Book ID
115523361
Publisher
IEEE
Year
1998
Tongue
English
Weight
461 KB
Volume
45
Category
Article
ISSN
0018-9499

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES