Single Event Upset Vulnerability of Selected 4K and 16K CMOS Static RAM's

✍ Scribed by Kolasinski, W. A.; Koga, R.; Blake, J. B.; Brucker, G.; Pandya, P.; Petersen, E.; Price, W.

• Book ID: 114662512
• Publisher: IEEE
• Year: 1982
• Tongue: English
• Weight: 844 KB
• Volume: 29
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1982.4336493