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In-depth profile of altered layers of copper-nickel alloys formed by sputtering

✍ Scribed by Kuniake Watanabe; Masao Hashiba; Toshiro Yamashina

Book ID
118981860
Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
439 KB
Volume
69
Category
Article
ISSN
0039-6028

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## Abstract Depth profiling analysis of passive films grown on the surface of two nickel‐based alloys (Inconel 600 and Hastelloy C4) in NaCl media was carried out using Auger electron spectroscopy (AES) and ion sputtering. Improvement to the sequential sputtering model of Hofmann (1976) should be p