✦ LIBER ✦

Altered layer composition of sputtered InP(100) wafers: non-destructive concentration depth profiling

✍ Scribed by J. Zemek; O.A. Baschenko; M.A. Tyzykhov; P. Jiricek

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Non-destructive concentration depth prof

✍ J. Zemek; O.A. Baschenko; M.A. Tyzykhov 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 525 KB

Depth profile investigations of metallic

✍ S. Stein; A. Reif; P. Streubel; A. Tschulik; H. Störi 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 318 KB

Thickness and in-depth composition profi

✍ Noboru Saeki; Ryuichi Shimizu 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 786 KB