✦ LIBER ✦

In-depth concentration profiling of garnet epilayers using secondary ion mass spectrometry

✍ Scribed by A. E. Morgan; H. W. Werner; J. M. Gourgout

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of concentration in depth

📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 137 KB

Temperature-controlled depth profiling i

✍ Christine M. Mahoney; Albert J. Fahey; Greg Gillen; Chang Xu; James D. Batteas 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 217 KB

Recent applications of compositional dep

✍ J.A. Jackman; T.E. Jackman; P. Rousseau; L. Weaver 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 537 KB

Depth profiling of thin film heterostruc

✍ EO Ristolainen; M Puga-Lambers; B Panthangay; PH Holloway 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 433 KB

Depth-profiling of Cu-Ni sandwich sample

✍ W. O. Hofer; H. Liebl 📂 Article 📅 1975 🏛 Springer 🌐 English ⚖ 389 KB

Charge neutralization using secondary el

✍ Y. Ishizaki; T. Yamamoto; M. Fujii; M. Owari; M. Nojima; Y. Nihei 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 406 KB