Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

✍ Scribed by Christine M. Mahoney; Albert J. Fahey; Greg Gillen; Chang Xu; James D. Batteas

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 217 KB
• Volume: 252
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2006.02.078