๐”– Bobbio Scriptorium
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Improving Thermal Shock Test Reliability

โœ Scribed by Oliver Kenneth Power III

Book ID
110824200
Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
722 KB
Volume
72
Category
Article
ISSN
0002-7820

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In this work, the first reliability results of Thermal Cycling Tests (TCT, air-air test) and Thermal Shock Tests (TST, liquidliquid test) on medium power electronic components are discussed. The influence of dwell times, extremes temperatures and mean temperature is investigated. This study is based