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Improving Process Capability of Manufacturing Process by Application of Statistical Techniques

โœ Scribed by Gijo, E. V.


Book ID
111942581
Publisher
Taylor and Francis Group
Year
2005
Tongue
English
Weight
124 KB
Volume
17
Category
Article
ISSN
0898-2112

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Numerous process capability indices, including C p , C pk , C pm , and C pmk , have been proposed to provide measures of process potential and performance. In this paper, we consider some generalizations of these four basic indices to cover non-normal distributions. The proposed generalizations are