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An application of non-normal process capability indices

โœ Scribed by K. S. Chen; W. L. Pearn

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
68 KB
Volume
13
Category
Article
ISSN
0748-8017

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โœฆ Synopsis

Numerous process capability indices, including C p , C pk , C pm , and C pmk , have been proposed to provide measures of process potential and performance. In this paper, we consider some generalizations of these four basic indices to cover non-normal distributions. The proposed generalizations are compared with the four basic indices. The results show that the proposed generalizations are more accurate than those basic indices and other generalizations in measuring process capability. We also consider an estimation method based on sample percentiles to calculate the proposed generalizations, and give an example to illustrate how we apply the proposed generalizations to actual data collected from the factory.

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