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Improvement of the photovoltaic efficiency of a metal-insulator-semiconductor structure: Influence of interface states

✍ Scribed by P. Viktorovitch; G. Kamarinos

Book ID
121822679
Publisher
American Institute of Physics
Year
1977
Tongue
English
Weight
460 KB
Volume
48
Category
Article
ISSN
0021-8979

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The method of metal-insulator-semiconductor (MIS) structure interface analysis, based on applying a direct current pulse of preset amplitude to a MIS structure, is proposed. The variation of the voltage across the MIS structure is recorded while the current flows. The method allows measurement of in