๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Analysis of charges and surface states at the interfaces of semiconductor-insulator-semiconductor structures

โœ Scribed by L. S. Berman; E. I. Belyakova; L. S. Kostina; E. D. Kim; S. C. Kim

Book ID
110120424
Publisher
Springer
Year
2000
Tongue
English
Weight
55 KB
Volume
34
Category
Article
ISSN
1063-7826

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Method of metal-insulator-semiconductor
Method of metal-insulator-semiconductor structure interface analysis
โœ Bondarenko, G. G.; Andreev, V. V.; Loskutov, S. A.; Stolyarov, A. A. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 79 KB ๐Ÿ‘ 1 views

The method of metal-insulator-semiconductor (MIS) structure interface analysis, based on applying a direct current pulse of preset amplitude to a MIS structure, is proposed. The variation of the voltage across the MIS structure is recorded while the current flows. The method allows measurement of in