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A noncontact method to study the charge state of the semiconductor-insulator interface

✍ Scribed by V. V. Kryachko; M. N. Levin; A. V. Tatarintsev; E. N. Bormontov


Book ID
110140221
Publisher
Springer
Year
2004
Tongue
English
Weight
171 KB
Volume
49
Category
Article
ISSN
1063-7842

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