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Improvement of Reliability of GaN-Based Light-Emitting Diodes by Selective Wet Etching With p-GaN

โœ Scribed by Ha, G.-Y.; Park, T.-Y.; Kim, J.-Y.; Kim, D.-J.; Min, K.-I.; Park, S.-J.


Book ID
119803602
Publisher
IEEE
Year
2007
Tongue
English
Weight
300 KB
Volume
19
Category
Article
ISSN
1041-1135

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