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Improvement of Breakdown Characteristics of a Planar Microwave P-I-N Diode by the Bevelling Technique

✍ Scribed by Vaya, P. R. ;Kakati, D.


Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
136 KB
Volume
54
Category
Article
ISSN
0031-8965

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