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Improvement in accuracy of spectroscopic IR ellipsometry by the use of IR retarders

✍ Scribed by A. Röseler; W. Molgedey


Book ID
103109621
Publisher
Elsevier Science
Year
1984
Weight
331 KB
Volume
24
Category
Article
ISSN
0020-0891

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Spectroscopic ellipsometry in the infrared spectral range 250-5000 cm -1 is used for analysis of the dielectric response of Zn 1-x-y Be x Mg y Se and Zn 1-x-y Be x Mn y Se crystals grown by a high-pressure Bridgman method. Ellipsometric spectra display features in the spectral range 390-500 cm -1 as