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Improved single-pass approach for reliability analysis of digital combinational circuits

✍ Scribed by S.J. Seyyed Mahdavi; K. Mohammadi

Book ID: 108210909
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 518 KB
Volume: 51
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2010.08.011

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