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Improved resistive switching properties of Ti/ZrO2/Pt memory devices for RRAM application

✍ Scribed by Sheng-Yu Wang; Chen-Han Tsai; Dai-Ying Lee; Chih-Yang Lin; Chun-Chieh Lin; Tseung-Yuen Tseng


Book ID
118486082
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
842 KB
Volume
88
Category
Article
ISSN
0167-9317

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## Abstract On the polycrystalline La~0.7~Ca~0.3~MnO~3~ (LCMO) film, various top electrodes (TEs) have been prepared to form metal/LCMO/Pt devices, including Al, Ag and Ag–Al alloy with the atomic ratio of Ag/Al = 2:1. It is found that the switching polarity of the devices with Al as TE is opposite