We successfully fabricated the Gd 2 O 3 film for the application of resistive random access memory (RRAM). The resistive switching behavior of the Ti/Gd 2 O 3 /Pt capacitor structure could be both operated under positive or negative bias. However, there was a significant difference on the switching
β¦ LIBER β¦
Improved resistive switching properties of Ti/ZrO2/Pt memory devices for RRAM application
β Scribed by Sheng-Yu Wang; Chen-Han Tsai; Dai-Ying Lee; Chih-Yang Lin; Chun-Chieh Lin; Tseung-Yuen Tseng
- Book ID
- 118486082
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 842 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0167-9317
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