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Improvement of resistance switching properties for metal/La0.7Ca0.3MnO3/Pt devices

✍ Scribed by Yang, Rui ;Li, Xiaomin


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
660 KB
Volume
208
Category
Article
ISSN
0031-8965

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✦ Synopsis


Abstract

On the polycrystalline La~0.7~Ca~0.3~MnO~3~ (LCMO) film, various top electrodes (TEs) have been prepared to form metal/LCMO/Pt devices, including Al, Ag and Ag–Al alloy with the atomic ratio of Ag/Al = 2:1. It is found that the switching polarity of the devices with Al as TE is opposite to those with Ag as TE. For the Al layered devices, the endurance and switching speed have been effectively improved by decreasing the thickness of the Al electrode from 50 to 10 nm. Meanwhile, the endurance and yield of the resistance switching behaviour observed at Ag layered structure have been improved by alloying some Al into Ag electrode. The present work suggests a possible way to improve the resistance switching properties by adjusting the microstructure of the electrodes to modulate the interface structure of the metal/LCMO interface.


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## Abstract Resistance switching effect caused by external electric field was investigated in Pr~0.7~Ca~0.3~MnO~3~ (PCMO) thin films grown on (001)‐oriented LaAlO~3~, by using different metallic (Al, Pt, Au, Ti) electrodes. When Al was used as one or both of the electrodes, PCMO thin films exhibite