Improved performance by using TaON/SiO2 as dual tunnel layer in Charge-Trapping nonvolatile memory

✍ Scribed by Chen, J.X.; Xu, J.P.; Liu, L.; Huang, X.D.; Lai, P.T.

• Book ID: 122160533
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 971 KB
• Volume: 54
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2013.10.011