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Improved noise performance of GaAs MESFET's with selectively ion-implanted n+source regions

✍ Scribed by Ohata, K.; Nozaki, T.; Kawamura, N.

Book ID: 114592499
Publisher: IEEE
Year: 1977
Tongue: English
Weight: 237 KB
Volume: 24
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1977.18892

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