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High microwave and ultra-low noise performance of fully ion-implanted GaAs MESFETs with Au/WSiN T-shaped gate

✍ Scribed by Onodera, K.; Nishimura, K.; Asai, K.; Sugitani, S.


Book ID
114535429
Publisher
IEEE
Year
1993
Tongue
English
Weight
736 KB
Volume
40
Category
Article
ISSN
0018-9383

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