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Implication of rapid thermal annealing-induced cracks on the performance of multiple-quantum-well laser diodes

✍ Scribed by Yee, Hoshin H. ;Yu, Chih-Ping

Book ID: 115350690
Publisher: The Optical Society
Year: 2003
Tongue: English
Weight: 879 KB
Volume: 42
Category: Article
ISSN: 1559-128X
DOI: 10.1364/AO.42.002695

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