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Impedance spectroscopy characterization of resistance switching NiO thin films prepared through atomic layer deposition

✍ Scribed by You, Yil-Hwan; So, Byung-Soo; Hwang, Jin-Ha; Cho, Wontae; Lee, Sun Sook; Chung, Taek-Mo; Kim, Chang Gyoun; An, Ki-Seok

No coin nor oath required. For personal study only.

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