Electrical characterization of ZnO-based thin film nanodiodes fabricated through atomic layer deposition: Effect of electron beam irradiation on interfacial property

✍ Scribed by You, Yil-Hwan; Kim, Min-Kyeong; Lee, Byeong-Cheol; Hwang, Jinha

• Book ID: 122029339
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 609 KB
• Volume: 40
• Category: Article
• ISSN: 0272-8842
• DOI: 10.1016/j.ceramint.2013.08.109