This study investigates the tensile-strained growth of LaAlO 3 on SrTiO 3 (0 0 1) substrate by molecular beam epitaxy (MBE). Growth was controlled in situ by reflection high energy electron diffraction (RHEED). The characterization was carried out ex situ by photoemission and atomic force microscopy
Impacts of compressive strain on phase diagram of epitaxial Pr0.5Sr0.5MnO3 films grown on LaAlO3 (0 0 1)
β Scribed by Liping Chen; Yuansha Chen; Yubin Ma; Guijun Lian; Guangcheng Xiong; J. Gao
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 267 KB
- Volume
- 406
- Category
- Article
- ISSN
- 0921-4526
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