Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in OLEDs

✍ Scribed by Pinato, A.; Cester, A.; Meneghini, M.; Wrachien, N.; Tazzoli, A.; Xia, S.; Adamovich, V.; Weaver, M.S.; Brown, J.J.; Zanoni, E.; Meneghesso, G.

• Book ID: 114619846
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 946 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2034505