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Impact of Strained-Si PMOS Transistors on SRAM Soft Error Rates

โœ Scribed by Mahatme, Nihaar N.; Bhuva, Bharat L.; Fang, Yi-Pin; Oates, Anthony S.


Book ID
118116455
Publisher
IEEE
Year
2012
Tongue
English
Weight
639 KB
Volume
59
Category
Article
ISSN
0018-9499

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