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A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity

✍ Scribed by Mostafa, H.; Anis, M.; Elmasry, M.


Book ID
118275685
Publisher
IEEE
Year
2011
Tongue
English
Weight
211 KB
Volume
19
Category
Article
ISSN
1063-8210

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