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[IEEE Digest of Technical Papers., 1990 Symposium on VLSI Circuits - Honolulu, Hawaii, USA (1990.06.7-1990.06.9)] Digest of Technical Papers., 1990 Symposium on VLSI Circuits - A new soft-error phenomenon in ULSI SRAMs-inverted dependence of soft-error rate on cycle time

✍ Scribed by Murakami, S.; Wada, T.; Eino, M.; Ukita, M.; Nishimura, Y.; Anami, K.

No coin nor oath required. For personal study only.

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