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Impact of Strain on Drain Current and Threshold Voltage of Nanoscale Double Gate Tunnel Field Effect Transistor: Theoretical Investigation and Analysis

✍ Scribed by Saurabh, Sneh; Kumar, M. Jagadesh


Book ID
120493197
Publisher
Institute of Pure and Applied Physics
Year
2009
Tongue
English
Weight
242 KB
Volume
48
Category
Article
ISSN
0021-4922

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