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Effect of Drain Doping Profile on Double-Gate Tunnel Field-Effect Transistor and its Influence on Device RF Performance

✍ Scribed by Vijayvargiya, Vikas; Vishvakarma, Santosh Kumar

Book ID: 127167045
Publisher: IEEE
Year: 2014
Tongue: English
Weight: 851 KB
Volume: 13
Category: Article
ISSN: 1536-125X
DOI: 10.1109/tnano.2014.2336812

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