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Impact of polysilicon emitter interfacial layer engineering on the 1/f noise of bipolar transistors

โœ Scribed by Simoen, E.; Decoutere, S.; Cuthbertson, A.; Claeys, C.L.; Deferm, L.


Book ID
114536652
Publisher
IEEE
Year
1996
Tongue
English
Weight
946 KB
Volume
43
Category
Article
ISSN
0018-9383

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