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Effect of interfacial oxide thickness on 1/f noise in polysilicon emitter BJTs

✍ Scribed by Md Mazhar Ul Hoque; Celik-Butler, Z.; Lan, D.; Weiser, D.; Trogolo, J.; Green, K.R.


Book ID
114617538
Publisher
IEEE
Year
2004
Tongue
English
Weight
562 KB
Volume
51
Category
Article
ISSN
0018-9383

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