✦ LIBER ✦

Impact of Parameter Variations on Circuits and Microarchitecture

✍ Scribed by Unsal, O.S.; Tschanz, J.W.; Bowman, K.; De, V.; Vera, X.; Gonzalez, A.; Ergin, O.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Yield sensitivity of HEMT circuits to pr

✍ Sarker, J.C.; Purviance, J.E. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 442 KB

The impact of intra-die device parameter

✍ Eisele, M.; Berthold, J.; Schmitt-Landsiedel, D.; Mahnkopf, R. 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 271 KB

Hierarchical Simulation of Process Varia

✍ Lorenz, J.K.; Bar, E.; Clees, T.; Jancke, R.; Salzig, C.P.J.; Selberherr, S. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 315 KB

Hierarchical Simulation of Process Varia

✍ Lorenz, J.K.; Bar, E.; Clees, T.; Evanschitzky, P.; Jancke, R.; Kampen, C.; Pasc 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 982 KB

Impact of extrinsic and intrinsic parame

✍ Bowman, K.A.; Xinghai Tang; Eble, J.C.; Menldl, J.D. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 218 KB

Impact of parameter covariance on fault

✍ Papakostas, D.K.; Hatzopoulos, A.A. 📂 Article 📅 2003 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 303 KB