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The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits

✍ Scribed by Eisele, M.; Berthold, J.; Schmitt-Landsiedel, D.; Mahnkopf, R.

Book ID: 126211608
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 271 KB
Volume: 5
Category: Article
ISSN: 1063-8210
DOI: 10.1109/92.645062

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