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Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit performance

✍ Scribed by Bowman, K.A.; Xinghai Tang; Eble, J.C.; Menldl, J.D.


Book ID
119775633
Publisher
IEEE
Year
2000
Tongue
English
Weight
218 KB
Volume
35
Category
Article
ISSN
0018-9200

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