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Impact of line width roughness on the matching performances of next-generation devices

โœ Scribed by C. Gustin; L.H.A. Leunissen; A. Mercha; S. Decoutere; G. Lorusso

Book ID
108289907
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
964 KB
Volume
516
Category
Article
ISSN
0040-6090

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