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Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration

✍ Scribed by Bowman, K.A.; Duvall, S.G.; Meindl, J.D.

Book ID: 119776014
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 198 KB
Volume: 37
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.982424

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