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[IEEE 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) - San Francisco, CA, USA (Feb 3-7, 2002)] 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) - Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

โœ Scribed by Tschanz, J.; James Kao, ; Narendra, S.; Nair, R.; Antoniadis, D.; Chandrakasan, A.; Vivek De,


Book ID
121278102
Publisher
IEEE
Year
2002
Weight
471 KB
Volume
2
Category
Article
ISBN-13
9780780373358

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