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[IEEE 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (3-7 Feb. 2002)] 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) - Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

✍ Scribed by Tschanz, J.; Kao, J.; Narendra, S.; Nair, R.; Antoniadis, D.; Chandrakasan, A.; Vivek De,

Book ID: 124157008
Publisher: IEEE
Year: 2002
Weight: 590 KB
Volume: 1
Category: Article
ISBN-13: 9780780373358
DOI: 10.1109/ISSCC.2002.993112

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