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Impact-ionization effects on the high-frequency behavior of HFETs

✍ Scribed by Isler, M.; Schunemann, K.

Book ID: 114659962
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 253 KB
Volume: 52
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.2004.823553

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