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Impact ionization suppression by quantum confinement: Effects on the DC and microwave performance of narrow-gap channel InAs/AlSb HFET's

✍ Scribed by Bolognesi, C.R.; Dvorak, M.W.; Chow, D.H.


Book ID
114537696
Publisher
IEEE
Year
1999
Tongue
English
Weight
236 KB
Volume
46
Category
Article
ISSN
0018-9383

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