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Impact Ionization Coefficients in 4H-SiC by Ultralow Excess Noise Measurement

โœ Scribed by Green, J.E.; Wei Sun Loh; Marshall, A.R.J.; Ng, B.K.; Tozer, R.C.; David, J.P.R.; Soloviev, S.I.; Sandvik, P.M.


Book ID
114620901
Publisher
IEEE
Year
2012
Tongue
English
Weight
646 KB
Volume
59
Category
Article
ISSN
0018-9383

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