Elastic mapping of heterogeneous nanostr
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Dinelli, F.; Assender, H. E.; Takeda, N.; Briggs, G. A. D.; Kolosov, O. V.
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Article
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1999
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John Wiley and Sons
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English
โ 304 KB
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Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally introduced to study the surface elastic properties of sti โ materials. We report elastic images of heterogeneous nanostructures with a lateral resolution of the order of a few nanometres. One of the ma